SPIP™ is the preferred software package for nano- and microscale image processing at high-tech companies and leading research institutes in more than 50 countries.
SPIP™ supports 91 file formats for various instrument types, including:
SPM, AFM, STM
SEM, TEM
Interferometers
Confocal Microscopes
Profilers
Optical Microscopes
Many of the world's most trusted brands use SPIP™ - here are a few of them:
The grain size measurement module is very helpful to measure individual nanoparticles deposited on mica. We use the height measured by AFM as the size (diameter) of the particle.
Don Chernoff, PhD., President, Advanced Surface Microscopy
