Thank you for choosing the Scanning Probe Image Processor, SPIP™!
SPIP™ offers an unmatched level of image processing facilities designed with uncompromising attention to accuracy, efficiency, and data presentation excellence.
To get at kick-start we recommend spending a few minutes on the video tutorials available from the SPIP™ welcome screen appearing when SPIP™ is started the first time. Try to perform similar analysis on the demonstration images also directly available from the welcome screen. Although the tutorials by no means cover all the facilities in SPIP™, you will learn that even the most challenging image processing problems may be solved by a few mouse clicks.
SPIP™ i based on a modern Ribbon based user interface where contextual tabs a logical grouped and providing easy access to all SPIP functions. This makes it easy for new as well as SPIP™ users of older versions to learn how to work effectively with image processing.
SPIP™ is a comprehensive product containing many generic analytical and visualization tools that can be applied on various types of images and curve data, for example images from electron-, interference-, and optical microscopes. In particularly SPIP™ has specialized tools for correcting and analyzing Scanning Probe Microscope (SPM) data including force curve analysis and Continuous Imaging Tunneling Spectroscopy (CITS).
In addition to detailed surface characterization, SPIP™ is a powerful tool for characterizing scanning probe instruments and diagnosing environmental noise and vibration problems. SPIP™ is therefore a valuable data analysis program for a wide range of applications and means higher quality and added value for instrument designers as well for end-users within industry and research institutes.
We are convinced that SPIP™ will work to your full satisfaction and we are committed to continue the innovative development of SPIP™ in close contact with our customers. Should you therefore have additional requirements or ideas for improvements, you are most welcome to contact us.
Jan F. Jørgensen
CEO
Image Metrology A/S