Join us at MRS Fall Meeting & Exhibit in Boston

Posted on November 20, 2016February 23, 2017 by Jan Friis Jorgensen

We will be exhibiting at the 2016 MRS Fall Meeting in Boston on November 29-December 1., and look forward to meeting you at our booth no. 1100 for free image processing advice and a SPIP demo.

Feel free to bring your own image data on a memory stick if you want image processing experts to give you detailed advice on how to process your own data.

Nanosurf and Image Metrology renew OEM agreement

Posted on November 18, 2016February 15, 2017 by Jan Friis Jorgensen

Nanosurf now offers SPIP™ as a standard component in their C3000 Advanced Spectroscopy Option, and as an optional component in their entire product range.

Founded in 1997, Nanosurf is a Swiss based high-tech company providing scanning probe microscopes to customers around the globe. The product range starts with very compact instruments, followed by state-of-the-art research systems, all the way up to fully customized and comprehensive solutions. Nanosurf is valued for their innovative approach, the modularity, and the ease of use of their products by its large customer base in research, industry and teaching.

Contact:

Nanosurf AG

Gräubernstrasse 12-14

4410 Liestal

Switzerland

Tel.: +41 61 927 47 47

Web: www.nanosurf.com

SPIP™ 6.6 featuring the new improved ImageMet Explorer™

Posted on November 18, 2016February 23, 2017 by Jan Friis Jorgensen

Image Metrology is proud to announce the release of SPIP™ 6.6 featuring the new improved ImageMet Explorer™ with more speed and efficiency for searching, sorting and exploring files.